Patrick Grother | Lead Scientist
NIST

Patrick Grother, Lead Scientist, NIST

Patrick Grother is the lead scientist at the National Institute of Standards and Technology in the United States Department of Commerce responsible for biometric standards and testing. He directs the IREX, FRTE, FATE and FIVE programs, the world’s largest public independent evaluations of iris and face recognition technologies that support national scale identity management. These tests give quantitative support to developers, end-users and policy makers faced with algorithm selection, performance adequacy assessment, and procurement specification.  Patrick has received U. S. Department of Commerce Gold Medals on three occasions, for work on biometrics in border control, for contributions to the PIV credential, and for work defining and quantifying demographic effects in biometrics. His current research interests relate biometric failure analysis, image quality, risk mitigation, and AI trustworthiness.  Patrick assists several US Government agencies on research, development, and evaluation. Since 2018 he serves as chair of the SC37 committee on Biometrics and is editor of five ISO standards there. He is the recipient of the IEC 1906 Award and the ANSI Lohse IT Medal.

Appearances:



Identity Week America - Day 1 @ 13:20

Facial biometrics presentation

last published: 01/Apr/26 09:05 GMT

back to speakers

GET INVOLVED AT IDENTITY WEEK AMERICA

 

 

TO SPONSOR


Sophia Farwell

s.farwell@sciencemediapartners.com

 

 

TO SPEAK


Francis Wright

frank.wright@terrapinn.com

 

 

MARKETING & PRESS


Rob Arrenberg

r.arrenberg@sciencemediapartners.com