Vincent Doan | Distinguished Engineer
Sandisk

Vincent V. Doan is a distinguished reliability engineering leader with more than two decades of experience across storage, aerospace, telecom, semiconductor, and consumer electronics industries. Vincent has held engineering and leadership roles at various companies from PCB fabrication, magnetic read sensor, fiber optic telecom, in-flight entertainment system, advanced digital cinema, to solid state drive (SSD); he is currently at Sandisk, where he has led hardware design reliability, system integration, and advanced reliability engineering. His work spans design for reliability (DfR), reliability test development, failure analysis, and system‑level qualification. Vincent Doan received Ph.D. in Inorganic/Material Chemistry from University of California at San Diego.

Appearances:

Future of Memory and Storage - Day 1 @ 09:50

Sample Estimation for Reliability Demonstration Test using Gam-ma distribution with Kerman neutral prior

Chi-Square methodology has traditionally been widely used in the microelectronics industry for planning demonstration tests. While the Chi-square distribution is suitable for sample estimation when product reliability is unknown, it tends to significantly overestimate failure rate projections for products with known reliability characteristics. This often results in over-engineering of products or establishing substantially higher reliability targets. This paper proposes the use of Gamma distribution with a Kerman neutral prior for Reliability Demonstration Test (RDT) planning, particularly for products with existing prior information such as prequalification test data, component level reliability data et al. This distribution offers a more accurate and statistically appropriate approach, aligning better with point estimates and reliability assessments when using Maximum Likelihood Estimation. Utilizing this methodology in SSD sample planning helps in achieving reliability targets, either by using smaller sample sizes or by reducing the reliability test durations. This can help meet reliability objectives at a lower cost without compromising product quality and reliability and ad

Vijaya Rana, Principal Engineer, Reliability Engineering, Sandisk