Varun Sundaresan | Sr. Manager, Reliability Engineering
Sandisk

Varun Sundaresan is a Senior Manager for Reliability Engineering at SanDisk. He has about 10+ years of experience in NAND Flash business and in total 18 years of Technological experience with Firmware, System Validation and OEM background. He manages the Reliability engineering for Automotive, Mobile and Embedded BGA products at SanDisk. He champions the IATF 16949 and ASPICE L3 audits for qualification in Israel and India.

Appearances:

Future of Memory and Storage - Day 3 @ 13:05

Shrinking RDT Without Relaxing It: Parametric Telemetry, Risk Allocation, and Adaptive Stress for NAND

Reliability testing is cornerstone of flash memory qualification, but traditional Reliability Demonstration Testing (RDT) requires large sample sizes, long test durations, and high cost, limiting qualification speed as NAND technologies scale. This paper presents a practical framework for Sample Size Reduction (SSR) in reliability testing for modern NAND‑based storage devices.The approach replaces pass/fail assessment with parametric‑driven testing using continuous health indicators such as endurance behaviour, error rate trends, wear‑leveling efficiency, latency stability, and performance degradation. Statistical confidence is preserved through binomial and parametric analysis with risk‑based allocation across life phases, while adaptive stress profiling removes redundant testing without reducing failure sensitivity. Applied across reliability and performance phases, this methodology enables meaningful sample size reduction without compromising qualification requirements, lowering cost and timelines while improving tester utilization.

Balakrishna Ademmagari, Senior Engineer, Reliability Engineering, Sandisk