Balakrishna Ademmagari | Senior Engineer, Reliability Engineering
Sandisk
Balakrishna Ademmagari is a Senior Engineer and Reliability Qualification Lead in Reliability Engineering at SanDisk, with 8+ years of experience in NAND flash reliability and product qualification. Based in Bangalore, India, he leads end‑to‑end reliability qualification, endurance validation, and failure analysis for NAND‑based BGA storage products. Balakrishna drives Reliability Demonstration Testing (RDT) execution, advances data‑driven reliability methodologies, and partners closely with firmware, validation, and memory technology teams to ensure robust, on‑time product readiness.
Appearances:
Future of Memory and Storage - Day 3 @ 13:05
Shrinking RDT Without Relaxing It: Parametric Telemetry, Risk Allocation, and Adaptive Stress for NAND
Reliability testing is cornerstone of flash memory qualification, but traditional Reliability Demonstration Testing (RDT) requires large sample sizes, long test durations, and high cost, limiting qualification speed as NAND technologies scale. This paper presents a practical framework for Sample Size Reduction (SSR) in reliability testing for modern NAND‑based storage devices.The approach replaces pass/fail assessment with parametric‑driven testing using continuous health indicators such as endurance behaviour, error rate trends, wear‑leveling efficiency, latency stability, and performance degradation. Statistical confidence is preserved through binomial and parametric analysis with risk‑based allocation across life phases, while adaptive stress profiling removes redundant testing without reducing failure sensitivity. Applied across reliability and performance phases, this methodology enables meaningful sample size reduction without compromising qualification requirements, lowering cost and timelines while improving tester utilization.
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