Karthik Balan | Associate Director
Samsung Semiconductor India Research Pvt Ltd
Karthik is an Associate Director at Samsung Electronics (SSIR), he has experience of 21 years in Embedded System Testing and last 13 years in Memory Solutions Tests for NVMe, SAS, CXL, etc. He currently works on architecting the test coverage and test solutions for NVMe Enterprise SSDs. Driving towards shift-left approach and open-source enablement for NVMe SSD qualifications
Appearances:
Future of Memory and Storage - Day 3 @ 08:55
Secure Sideband Management for Data‑Center Storage Systems
The AI/ML era is driving an unprecedented explosion of data generation,making confidentiality and integrity of data mission critical. Hence,industry has embraced security protocols such as IDE, SPDM, that provide authentication and attestation capabilities across storage/memory stack. Leading-edge solutions such as NVMe/CXL-based devices are being designed with these protocols,necessitating comprehensive validation of the security mechanisms. However,current test tools face limitations in modularity and debuggability, restricting validation scope.This paper presents a Python‑based SPDM SDK for establishing mutually authenticated SPDM (Security Protocol and Data Model) session and establishing secured sideband management. This framework leverages cryptographic libraries and defines seamless flow to validate SPDM protocol. The framework provides strong cryptographic guarantee, enabling safe and reliable management functions over sideband channels. We will also discuss on demonstrative use case for Secure SPDM session establishment and Firmware download over PLDM. This work contributes a practical,opensource solution for securing sideband management in emerging datacenter ecosystems.
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