Kris Ranganath | Vice President, Technology And Solutions

Kris Ranganath, Vice President, Technology And Solutions, NEC

Kris Ranganath has over 30 years of technology management and solution engineering experience in the public safety and communication industry. In his current role, Mr. Ranganath leads the product and solution development practices in NEC Advanced Recognition Systems division (ARS). He works closely with NEC core technology groups to set roadmap on biometrics and analytics technologies, and manages development, testing, and integration of new technologies.

He is actively engaged in architecting large-scale identity, intelligence and forensic recognition systems. Under his leadership, ARS has delivered biometrics-based law enforcement solutions to the most populous states/cities in the US, and to several federal agencies like the U.S. DHS Office of Biometrics Identity Management (OBIM), U.S. Customs and Border Protection (CBP) and to several other civil agencies. He is also actively engaged in delivering solutions to international public safety agencies, and has in the past architected biometrics solutions for very large billion+ identity solutions like India AADHAAR.

Kris leads NEC Corporation of America Customer Experience Solutions Center of Excellence (CXCoE). NECAM CXCoE delivers friction-less AI driven sensor fusion technology to Aviation, Parks, Stadiums, and Hospitality markets.


connect:ID Day 1 @ 16:00

Biometrics Sensor Fusion for Enhanced Customer Experience

Digital transformation led to e-commerce, mobile apps and a paper-less world, with easier access to information, communication, and services. Kris Ranganath will address that as we make progress in AI and analytics and move towards the next generation of transformation, we should shift attention to how sensor fusion can combine data from all available sensors, mobile/wearables, biometrics and analytics to secure physical infrastructure and provide friction-less, immersive experiences to all.
last published: 01/May/19 16:15 GMT

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