Andrew Pollard | Research Scientist
National Physical Laboratory

Andrew is leading the Surface and Nanoanalysis Group's research into the measurement of graphene, other graphene-like advanced 2-D materials, and associated devices. This metrology research focuses on the actual measurement of the materials with a range of surface characterisation techniques, such as Raman spectroscopy and tip-enhanced Raman spectroscopy (TERS), scanning probe microscopies (SPM), secondary ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS) and ellipsometry. Andrew is also engaged with organisations in the emerging graphene industry, advising on aspects of standards and measurement in this area, and is on the advisory board of the Graphene Stakeholders Association (GSA).